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Information card for entry 4085510
Preview
| Coordinates | 4085510.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H9 Cl Fe Si |
|---|---|
| Calculated formula | C10 H9 Cl Fe Si |
| SMILES | [Fe]123456789[c]%10([SiH](Cl)[c]%115[cH]6[cH]7[cH]8[cH]9%11)[cH]1[cH]2[cH]3[cH]4%10 |
| Title of publication | Tuning the Polymerization Behavior of Silicon-Bridged [1]Ferrocenophanes Using Bulky Substituents |
| Authors of publication | Musgrave, Rebecca A.; Russell, Andrew D.; Whittell, George R.; Haddow, Mairi F.; Manners, Ian |
| Journal of publication | Organometallics |
| Year of publication | 2015 |
| Journal volume | 34 |
| Journal issue | 5 |
| Pages of publication | 897 |
| a | 7.3059 ± 0.0007 Å |
| b | 19.4204 ± 0.0017 Å |
| c | 7.4875 ± 0.0008 Å |
| α | 90° |
| β | 117.912 ± 0.007° |
| γ | 90° |
| Cell volume | 938.77 ± 0.17 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1251 |
| Residual factor for significantly intense reflections | 0.1008 |
| Weighted residual factors for significantly intense reflections | 0.2268 |
| Weighted residual factors for all reflections included in the refinement | 0.2405 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.203 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4085510.html
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Users of the data should acknowledge the original authors of the
structural data.