Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4086162
Preview
| Coordinates | 4086162.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H36 N2 O2 W |
|---|---|
| Calculated formula | C20 H36 N2 O2 W |
| SMILES | [W]12345(N=O)([N]6(C5)CCOCC6)([c]5([c]4([c]3([c]2([c]15C)C)C)C)C)CCC(C)C |
| Title of publication | Thermal Chemistry of Cp*W(NO)(H)(η3-allyl) Complexes |
| Authors of publication | Baillie, Rhett A.; Wakeham, Russell J.; Lefèvre, Guillaume P.; Béthegnies, Aurélien; Patrick, Brian O.; Legzdins, Peter; Rosenfeld, Devon C. |
| Journal of publication | Organometallics |
| Year of publication | 2015 |
| Journal volume | 34 |
| Journal issue | 13 |
| Pages of publication | 3428 |
| a | 7.9811 ± 0.0009 Å |
| b | 9.0684 ± 0.001 Å |
| c | 15.7146 ± 0.0018 Å |
| α | 80.986 ± 0.003° |
| β | 78.527 ± 0.003° |
| γ | 74.162 ± 0.003° |
| Cell volume | 1066 ± 0.2 Å3 |
| Cell temperature | 90 ± 2 K |
| Ambient diffraction temperature | 90 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0337 |
| Residual factor for significantly intense reflections | 0.0316 |
| Weighted residual factors for significantly intense reflections | 0.078 |
| Weighted residual factors for all reflections included in the refinement | 0.0785 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.429 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4086162.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.