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Information card for entry 4086363
Preview
| Coordinates | 4086363.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31 H59 Cl6 N O Os P2 |
|---|---|
| Calculated formula | C31 H59 Cl6 N O Os P2 |
| SMILES | [OsH](Cl)(Cl)([P](C(C)C)(C(C)C)C(C)C)([P](C(C)C)(C(C)C)C(C)C)#CCCCC(=O)Nc1ccccc1.ClCCl.ClCCl |
| Title of publication | Amide-Directed Formation of Five-Coordinate Osmium Alkylidenes from Alkynes. |
| Authors of publication | Casanova, Noelia; Esteruelas, Miguel A.; Gulías, Moisés; Larramona, Carmen; Mascareñas, José L; Oñate, Enrique |
| Journal of publication | Organometallics |
| Year of publication | 2016 |
| Journal volume | 35 |
| Journal issue | 2 |
| Pages of publication | 91 - 99 |
| a | 8.849 ± 0.002 Å |
| b | 12.11 ± 0.003 Å |
| c | 19.188 ± 0.005 Å |
| α | 93.888 ± 0.004° |
| β | 92.002 ± 0.004° |
| γ | 105.872 ± 0.004° |
| Cell volume | 1970.2 ± 0.8 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0581 |
| Residual factor for significantly intense reflections | 0.0395 |
| Weighted residual factors for significantly intense reflections | 0.0689 |
| Weighted residual factors for all reflections included in the refinement | 0.0754 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4086363.html
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Users of the data should acknowledge the original authors of the
structural data.