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Information card for entry 4086582
Preview
| Coordinates | 4086582.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C35 H48 Be2 N2 P2 Si2 |
|---|---|
| Calculated formula | C35 H48 Be2 N2 P2 Si2 |
| SMILES | P1(=[N]([Si](C)(C)C)[Be]3([C]21P(=[N]([Si](C)(C)C)[Be]32CC)(c1ccccc1)c1ccccc1)CC)(c1ccccc1)c1ccccc1 |
| Title of publication | Synthesis and Structure of Bis(diphenylphosphinimino)methanide and Bis(diphenylphosphinimino)methanediide Beryllium Complexes |
| Authors of publication | Bayram, Melike; Naglav, Dominik; Wölper, Christoph; Schulz, Stephan |
| Journal of publication | Organometallics |
| Year of publication | 2016 |
| Journal volume | 35 |
| Journal issue | 14 |
| Pages of publication | 2378 |
| a | 11.483 ± 0.0008 Å |
| b | 17.7068 ± 0.0013 Å |
| c | 18.3945 ± 0.0015 Å |
| α | 90.411 ± 0.004° |
| β | 91.935 ± 0.004° |
| γ | 90.137 ± 0.004° |
| Cell volume | 3737.9 ± 0.5 Å3 |
| Cell temperature | 100 ± 1 K |
| Ambient diffraction temperature | 100 ± 1 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0709 |
| Residual factor for significantly intense reflections | 0.0603 |
| Weighted residual factors for significantly intense reflections | 0.1528 |
| Weighted residual factors for all reflections included in the refinement | 0.1629 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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