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Information card for entry 4087799
Preview
| Coordinates | 4087799.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37 H71 N3 P Si6 Y |
|---|---|
| Calculated formula | C37 H71 N3 P Si6 Y |
| SMILES | [Y](C[P+](c1ccccc1)(c1ccccc1)c1ccccc1)(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C |
| Title of publication | Yttrium-Catalyzed Amine‒Silane Dehydrocoupling: Extended Reaction Scope with a Phosphorus-Based Ligand |
| Authors of publication | Nako, Adi E.; Chen, Wenyi; White, Andrew J. P.; Crimmin, Mark R. |
| Journal of publication | Organometallics |
| Year of publication | 2015 |
| Journal volume | 34 |
| Journal issue | 17 |
| Pages of publication | 4369 |
| a | 12.2125 ± 0.0003 Å |
| b | 16.1022 ± 0.0003 Å |
| c | 12.5748 ± 0.0002 Å |
| α | 90° |
| β | 97.0732 ± 0.0019° |
| γ | 90° |
| Cell volume | 2453.99 ± 0.09 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 6 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0486 |
| Residual factor for significantly intense reflections | 0.0367 |
| Weighted residual factors for significantly intense reflections | 0.0746 |
| Weighted residual factors for all reflections included in the refinement | 0.0792 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4087799.html
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Users of the data should acknowledge the original authors of the
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