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Information card for entry 4087822
Preview
| Coordinates | 4087822.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H70 Cl2 Cu N2 |
|---|---|
| Calculated formula | C44 H70 Cl2 Cu N2 |
| SMILES | [Cu](Cl)=C1N(C=CN1c1c(cccc1C(CCC)CCC)C(CCC)CCC)c1c(cccc1C(CCC)CCC)C(CCC)CCC.ClCCCl |
| Title of publication | Development of N-Heterocyclic Carbene‒Copper Complexes for 1,3-Halogen Migration |
| Authors of publication | Schmid, Steven C.; Van Hoveln, Ryan; Rigoli, Jared W.; Schomaker, Jennifer M. |
| Journal of publication | Organometallics |
| Year of publication | 2015 |
| Journal volume | 34 |
| Journal issue | 16 |
| Pages of publication | 4164 |
| a | 12.008 ± 0.004 Å |
| b | 18.286 ± 0.007 Å |
| c | 21.544 ± 0.007 Å |
| α | 65.84 ± 0.02° |
| β | 82.773 ± 0.013° |
| γ | 84.096 ± 0.011° |
| Cell volume | 4275 ± 3 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100.01 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0748 |
| Residual factor for significantly intense reflections | 0.0418 |
| Weighted residual factors for significantly intense reflections | 0.0818 |
| Weighted residual factors for all reflections included in the refinement | 0.092 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.007 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4087822.html
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Users of the data should acknowledge the original authors of the
structural data.