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Information card for entry 4088262
Preview
| Coordinates | 4088262.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H22 F3 O6 P Si2 W |
|---|---|
| Calculated formula | C15 H22 F3 O6 P Si2 W |
| SMILES | [C@H]1(C[P@](C([Si](C)(C)C)[Si](C)(C)C)(O1)[W](C#[O])(C#[O])(C#[O])(C#[O])C#[O])C(F)(F)F |
| Title of publication | C-Trifluoromethyl-Substituted 1,2-Oxaphosphetane Complexes: Synthetic and Structural Study |
| Authors of publication | Kyri, Andreas W.; Schnakenburg, Gregor; Streubel, Rainer |
| Journal of publication | Organometallics |
| Year of publication | 2016 |
| Journal volume | 35 |
| Journal issue | 4 |
| Pages of publication | 563 |
| a | 9.3854 ± 0.0003 Å |
| b | 11.0383 ± 0.0002 Å |
| c | 22.054 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2284.77 ± 0.1 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.034 |
| Residual factor for significantly intense reflections | 0.028 |
| Weighted residual factors for significantly intense reflections | 0.0484 |
| Weighted residual factors for all reflections included in the refinement | 0.05 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4088262.html
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