Information card for entry 4089695

Structure parameters

• Formula: C49 H111 Cl2 Eu O16 Si4
• Calculated formula: C49 H111 Cl2 Eu O16 Si4
• SMILES: [Eu]1(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)([OH][Si](OC(C)(C)C)(OC(C)(C)C)[O]1C(C)(C)C)(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C.ClCCl
• Title of publication: Synthesis and Characterization of Rare Earth Siloxide Complexes, M[OSi(OtBu)3]3(L)x where L is HOSi(OtBu)3 and x = 0 or 1
• Authors of publication: Lapadula, Giuseppe; Conley, Matthew P.; Copéret, Christophe; Andersen, Richard A.
• Journal of publication: Organometallics
• Year of publication: 2014
• Journal volume: 34
• Journal issue: 11
• Pages of publication: 2271
• a: 13.7651 ± 0.0015 Å
• b: 13.8406 ± 0.0015 Å
• c: 21.602 ± 0.002 Å
• α: 75.5109 ± 0.0017°
• β: 81.1199 ± 0.0017°
• γ: 60.5631 ± 0.0015°
• Cell volume: 3467.8 ± 0.6 ų
• Cell temperature: 100 K
• Ambient diffraction temperature: 100 K
• Number of distinct elements: 6
• Space group number: 1
• Hermann-Mauguin space group symbol: P 1
• Hall space group symbol: P 1
• Residual factor for all reflections: 0.0498
• Residual factor for significantly intense reflections: 0.0413
• Weighted residual factors for significantly intense reflections: 0.0967
• Weighted residual factors for all reflections included in the refinement: 0.1012
• Goodness-of-fit parameter for all reflections included in the refinement: 1.041
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Diffraction radiation X-ray symbol: K-L~3~
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No