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Information card for entry 4101419
Preview
| Coordinates | 4101419.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H43 Lu |
|---|---|
| Calculated formula | C30 H43 Lu |
| SMILES | [Lu]12345678([c]%10([c]4([c]3([c]2([c]1%10C)C)C)C)C)([c]1([c]5([c]6([c]7([c]81C)C)C)C)C)C=C1C(=C(C(=C1C)C)C)C |
| Title of publication | Organolutetium vinyl and tuck-over complexes via C-H bond activation. |
| Authors of publication | Evans, William J; Champagne, Timothy M; Ziller, Joseph W |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2006 |
| Journal volume | 128 |
| Journal issue | 44 |
| Pages of publication | 14270 - 14271 |
| a | 8.606 ± 0.004 Å |
| b | 9.714 ± 0.004 Å |
| c | 16.544 ± 0.007 Å |
| α | 83.991 ± 0.007° |
| β | 89.722 ± 0.007° |
| γ | 73.047 ± 0.007° |
| Cell volume | 1315.2 ± 1 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0254 |
| Residual factor for significantly intense reflections | 0.0237 |
| Weighted residual factors for significantly intense reflections | 0.0581 |
| Weighted residual factors for all reflections included in the refinement | 0.0591 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.085 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4101419.html
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Users of the data should acknowledge the original authors of the
structural data.