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Information card for entry 4101579
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| Coordinates | 4101579.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | (t-Bu2MeSi)2Sn-Sn(SiMet-Bu2)2C(Ph)=CH |
|---|---|
| Formula | C44 H90 Si4 Sn2 |
| Calculated formula | C44 H90 Si4 Sn2 |
| Title of publication | (tBu2MeSi)2Sn=Sn(SiMetBu2)2: a distannene with a >Sn=Sn< double bond that is stable both in the solid state and in solution. |
| Authors of publication | Lee, Vladimir Ya; Fukawa, Tomohide; Nakamoto, Masaaki; Sekiguchi, Akira; Tumanskii, Boris L; Karni, Miriam; Apeloig, Yitzhak |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2006 |
| Journal volume | 128 |
| Journal issue | 35 |
| Pages of publication | 11643 - 11651 |
| a | 11.725 ± 0.0003 Å |
| b | 13.025 ± 0.0006 Å |
| c | 18.709 ± 0.0008 Å |
| α | 75.877 ± 0.002° |
| β | 87.714 ± 0.003° |
| γ | 68.845 ± 0.002° |
| Cell volume | 2580.44 ± 0.18 Å3 |
| Cell temperature | 120 K |
| Ambient diffraction temperature | 120 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0422 |
| Residual factor for significantly intense reflections | 0.0335 |
| Weighted residual factors for significantly intense reflections | 0.0881 |
| Weighted residual factors for all reflections included in the refinement | 0.0914 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4101579.html
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