Information card for entry 4103204

Structure parameters

• Common name: {[SiP(Ph)3]Pt-OEt2}{BArF}
• Formula: C90 H64 B F24 O P3 Pt Si
• Calculated formula: C90 H64 B F24 O P3 Pt Si
• SMILES: [Pt]123([Si](c4c([P]1(c1ccccc1)c1ccccc1)cccc4)(c1c([P]2(c2ccccc2)c2ccccc2)cccc1)c1c([P]3(c2ccccc2)c2ccccc2)cccc1)[O](CC)CC.[B-](c1cc(C(F)(F)F)cc(C(F)(F)F)c1)(c1cc(C(F)(F)F)cc(C(F)(F)F)c1)(c1cc(C(F)(F)F)cc(C(F)(F)F)c1)c1cc(C(F)(F)F)cc(C(F)(F)F)c1
• Title of publication: Four-Coordinate, trigonal Pyramidal Pt(II) and Pd(II) Complexes
• Authors of publication: Charlene Tsay; Neal P. Mankad; Jonas C. Peters
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2010
• Journal volume: 132
• Pages of publication: 13975 - 13977
• a: 13.1515 ± 0.0015 Å
• b: 17.621 ± 0.002 Å
• c: 19.654 ± 0.002 Å
• α: 65.549 ± 0.002°
• β: 77.723 ± 0.002°
• γ: 86.737 ± 0.002°
• Cell volume: 4048.9 ± 0.8 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0663
• Residual factor for significantly intense reflections: 0.0463
• Weighted residual factors for significantly intense reflections: 0.1053
• Weighted residual factors for all reflections included in the refinement: 0.1152
• Goodness-of-fit parameter for all reflections included in the refinement: 1.037
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No