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Information card for entry 4103334
Preview
| Coordinates | 4103334.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C59 H75 N2 O2 P2 Si3 Y |
|---|---|
| Calculated formula | C59 H75 N2 O2 P2 Si3 Y |
| SMILES | [Y]12(OC(c3ccccc3)(c3ccccc3)C[Si](C)(C)C)([O]3CCCC3)[N](=P(C2=P(N1[Si](C)(C)C)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)[Si](C)(C)C.Cc1ccccc1 |
| Title of publication | Regioselective C-H Activation and Sequential C-C and C-O Bond Formation Reactions of Aryl Ketones Promoted by an Yttrium Carbene |
| Authors of publication | David P. Mills; Lyndsay Soutar; William Lewis; Alexander J. Blake; Stephen T. Liddle |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2010 |
| Journal volume | 132 |
| Pages of publication | 14379 - 14381 |
| a | 22.6125 ± 0.0009 Å |
| b | 10.5065 ± 0.0004 Å |
| c | 24.5966 ± 0.0012 Å |
| α | 90° |
| β | 100.141 ± 0.004° |
| γ | 90° |
| Cell volume | 5752.3 ± 0.4 Å3 |
| Cell temperature | 90 ± 2 K |
| Ambient diffraction temperature | 90 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.0918 |
| Residual factor for significantly intense reflections | 0.0884 |
| Weighted residual factors for significantly intense reflections | 0.259 |
| Weighted residual factors for all reflections included in the refinement | 0.262 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.18 |
| Diffraction radiation wavelength | 1.5418 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4103334.html
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