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Information card for entry 4103493
Preview
| Coordinates | 4103493.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C4 H6 Cl4 O4 Tc2 |
|---|---|
| Calculated formula | C4 H6 Cl4 O4 Tc2 |
| SMILES | O1[Tc]2(Cl)([O]=C(C)O[Tc]2([O]=C1C)(Cl)Cl)Cl |
| Title of publication | Synthesis and Structure of Technetium Trichloride |
| Authors of publication | Frederic Poineau; Erik V. Johnstone; Philippe F. Weck; Eunja Kim; Paul M. Forster; Brian L. Scott; Alfred P. Sattelberger; Kenneth R. Czerwinski |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2010 |
| Journal volume | 132 |
| Pages of publication | 15864 - 15865 |
| a | 6.0303 ± 0.0012 Å |
| b | 6.5098 ± 0.0013 Å |
| c | 8.3072 ± 0.0016 Å |
| α | 112.082 ± 0.002° |
| β | 96.667 ± 0.003° |
| γ | 108.792 ± 0.003° |
| Cell volume | 275.42 ± 0.09 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0279 |
| Residual factor for significantly intense reflections | 0.0256 |
| Weighted residual factors for significantly intense reflections | 0.0689 |
| Weighted residual factors for all reflections included in the refinement | 0.0699 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4103493.html
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