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Information card for entry 4103502
Preview
| Coordinates | 4103502.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 10075 |
|---|---|
| Formula | C40 H50 Cu N4 O2 |
| Calculated formula | C40 H50 Cu N4 O2 |
| SMILES | [Cu]12(N(C(=O)c3[n]1c(ccc3)C(=O)N2c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)[n]1ccc(cc1)C(C)(C)C |
| Title of publication | An Anionic, tetragonal Copper(II) Superoxide Complex |
| Authors of publication | Patrick J. Donoghue; Aalo K. Gupta; David W. Boyce; Christopher J. Cramer; William B. Tolman |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2010 |
| Journal volume | 132 |
| Pages of publication | 15869 - 15871 |
| a | 10.724 ± 0.003 Å |
| b | 15.122 ± 0.005 Å |
| c | 11.474 ± 0.004 Å |
| α | 90° |
| β | 97.422 ± 0.004° |
| γ | 90° |
| Cell volume | 1845.1 ± 1 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0618 |
| Residual factor for significantly intense reflections | 0.0435 |
| Weighted residual factors for significantly intense reflections | 0.0938 |
| Weighted residual factors for all reflections included in the refinement | 0.1002 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4103502.html
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