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Information card for entry 4104650
Preview
| Coordinates | 4104650.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Ce@C82(Ad)-II |
|---|---|
| Chemical name | Ce@C82(Ad)-II |
| Formula | C109 H50 Ce N S2 |
| Calculated formula | C109 H50 Ce N S2 |
| Title of publication | Anisotropic Magnetic Behavior of Anionic Ce@C82 Carbene Adducts |
| Authors of publication | Yuta Takano; Motoki Aoyagi; Michio Yamada; Hidefumi Nikawa; Zdenek Slanina; Naomi Mizorogi; Midori O. Ishitsuka; Takahiro Tsuchiya; Yutaka Maeda; Takeshi Akasaka; Tatsuhisa Kato; Shigeru Nagase |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2009 |
| Journal volume | 131 |
| Pages of publication | 9340 - 9346 |
| a | 14.709 ± 0.004 Å |
| b | 15.587 ± 0.003 Å |
| c | 15.703 ± 0.003 Å |
| α | 75.603 ± 0.007° |
| β | 65.44 ± 0.008° |
| γ | 78.677 ± 0.009° |
| Cell volume | 3153.9 ± 1.2 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0715 |
| Residual factor for significantly intense reflections | 0.0593 |
| Weighted residual factors for significantly intense reflections | 0.147 |
| Weighted residual factors for all reflections included in the refinement | 0.1539 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4104650.html
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Users of the data should acknowledge the original authors of the
structural data.