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Information card for entry 4104827
Preview
| Coordinates | 4104827.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H84 Co4 P4 S4 |
|---|---|
| Calculated formula | C36 Co4 P4 S4 |
| SMILES | [Co]12345([Co]6789([Co]%10%111([Co]26([S]37)([S]5%10)([S]9%11)[P](C(C)C)(C(C)C)C(C)C)([S]48)[P](C(C)C)(C(C)C)C(C)C)[P](C(C)C)(C(C)C)C(C)C)[P](C(C)C)(C(C)C)C(C)C |
| Title of publication | Cubane-Type Co4S4 Clusters: Synthesis, Redox Series, and Magnetic Ground States |
| Authors of publication | Liang Deng; Eckhard Bill; Karl Wieghardt; R. H. Holm |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2009 |
| Journal volume | 131 |
| Pages of publication | 11213 - 11221 |
| a | 19.057 ± 0.003 Å |
| b | 12.78 ± 0.0019 Å |
| c | 39.863 ± 0.006 Å |
| α | 90° |
| β | 92.948 ± 0.003° |
| γ | 90° |
| Cell volume | 9696 ± 3 Å3 |
| Cell temperature | 130 ± 2 K |
| Ambient diffraction temperature | 130 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0919 |
| Residual factor for significantly intense reflections | 0.0749 |
| Weighted residual factors for significantly intense reflections | 0.1981 |
| Weighted residual factors for all reflections included in the refinement | 0.2109 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.07 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4104827.html
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Users of the data should acknowledge the original authors of the
structural data.