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Information card for entry 4104928
Preview
| Coordinates | 4104928.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | MKL01 |
|---|---|
| Formula | C52 H66 O4 P2 Pd2 |
| Calculated formula | C52 H66 O4 P2 Pd2 |
| SMILES | [Pd]12([P](c3c(c4ccccc24)cccc3)(C2CCCCC2)C2CCCCC2)[O]=C(O[Pd]2([P](c3c(cccc3)c3ccccc23)(C2CCCCC2)C2CCCCC2)[O]=C(O1)C)C |
| Title of publication | Influence of Biaryl Phosphine Structure on C-N and C-C Bond Formation |
| Authors of publication | Ramendra Pratap; Damon Parrish; Padmaja Gunda; D. Venkataraman; Mahesh K. Lakshman |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2009 |
| Journal volume | 131 |
| Pages of publication | 12240 - 12249 |
| a | 41.026 ± 0.0007 Å |
| b | 13.029 ± 0.0003 Å |
| c | 20.375 ± 0.0005 Å |
| α | 90° |
| β | 99.81 ± 0.0007° |
| γ | 90° |
| Cell volume | 10731.8 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0946 |
| Residual factor for significantly intense reflections | 0.0443 |
| Weighted residual factors for significantly intense reflections | 0.1084 |
| Weighted residual factors for all reflections included in the refinement | 0.1495 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4104928.html
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Users of the data should acknowledge the original authors of the
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