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Information card for entry 4105032
Preview
| Coordinates | 4105032.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | F9 O Sb Xe3 |
|---|---|
| Calculated formula | F9 O Sb Xe3 |
| Title of publication | On the XeF+/H2O System: Synthesis and Characterization of the Xenon(II) Oxide Fluoride Cation, FXeOXeFXeF+ |
| Authors of publication | Michael Gerken; Matthew D. Moran; Hélène P. A. Mercier; Bernard E. Pointner; Gary J. Schrobilgen; Berthold Hoge; Karl O. Christe; Jerry A. Boatz |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2009 |
| Journal volume | 131 |
| Pages of publication | 13474 - 13489 |
| a | 6.6872 ± 0.001 Å |
| b | 9.3056 ± 0.0017 Å |
| c | 8.8219 ± 0.0016 Å |
| α | 90° |
| β | 96.784 ± 0.005° |
| γ | 90° |
| Cell volume | 545.13 ± 0.16 Å3 |
| Cell temperature | 148 ± 2 K |
| Ambient diffraction temperature | 148 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0639 |
| Residual factor for significantly intense reflections | 0.0419 |
| Weighted residual factors for significantly intense reflections | 0.0836 |
| Weighted residual factors for all reflections included in the refinement | 0.0896 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.129 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4105032.html
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