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Information card for entry 4105067
Preview
| Coordinates | 4105067.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C100 H162 Ga2 Nd4 O2 Si10 |
|---|---|
| Calculated formula | C100 H162 Ga2 Nd4 O2 Si10 |
| Title of publication | A Comparison of 4f vs 5f Metal-Metal Bonds in (CpSiMe3)3M-ECp* (M = Nd, U; E = Al, Ga; Cp* = C5Me5): Synthesis, Thermodynamics, Magnetism, and Electronic Structure |
| Authors of publication | Stefan G. Minasian; Jamin L. Krinsky; Jeffrey D. Rinehart; Roy Copping; Tolek Tyliszczak; Markus Janousch; David K. Shuh; John Arnold |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2009 |
| Journal volume | 131 |
| Pages of publication | 13767 - 13783 |
| a | 13.1352 ± 0.001 Å |
| b | 13.1883 ± 0.001 Å |
| c | 17.824 ± 0.0013 Å |
| α | 90.58 ± 0.001° |
| β | 103.009 ± 0.001° |
| γ | 109.119 ± 0.001° |
| Cell volume | 2830.7 ± 0.4 Å3 |
| Cell temperature | 131 ± 2 K |
| Ambient diffraction temperature | 131 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0529 |
| Residual factor for significantly intense reflections | 0.0396 |
| Weighted residual factors for significantly intense reflections | 0.0893 |
| Weighted residual factors for all reflections included in the refinement | 0.0979 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4105067.html
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Users of the data should acknowledge the original authors of the
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