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Information card for entry 4105432
Preview
| Coordinates | 4105432.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | incar(mu~3~nitridotriscandium)-2,4,10,16,20,23,25,34,46,53,57,62,65,68,71,74- Hexadecakis(trifluoromethyl)- 2,4,10,16,20,23,25,34,46,53,57,62,65,68,71,74- hexadecahydro(C~80~-<i>I~h~</i>(7))[5,6])fullerene |
|---|---|
| Formula | C96 F48 N Sc3 |
| Calculated formula | C96 F48 N Sc3 |
| SMILES | c12C3(C4C5(c1c1c6c7c2C2(c8c3c3c9C=4C4(c%10c5c5C1(c1c%11C6(C6C7(c7c2c2c8c8c3c3c9C9(C4=C4c%10c%10c5c1c1c5c%11c%11C=6C6(c7c7c2c2c8c8C3(c3c9c9C4(c4c%12c(c1c%104)C1(c5c%11C4(C6=C7C5(c2c8C2(c3c9C%12(c3c1c4c5c23)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F.N([Sc])([Sc])[Sc] |
| Title of publication | Sc3N@(C80-Ih(7))(CF3)14 and Sc3N@(C80-Ih(7))(CF3)16. Endohedral Metallofullerene Derivatives with Exohedral Addends on Four and Eight Triple-Hexagon Junctions. Does the Sc3N Cluster Control the Addition Pattern or Vice Versa? |
| Authors of publication | Natalia B. Shustova; Yu-Sheng Chen; Mary A. Mackey; Curtis E. Coumbe; J. Paige Phillips; Steven Stevenson; Alexey A. Popov; Olga V. Boltalina; Steven H. Strauss |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2009 |
| Journal volume | 131 |
| Pages of publication | 17630 - 17637 |
| a | 13.8756 ± 0.0006 Å |
| b | 15.3985 ± 0.0007 Å |
| c | 16.7884 ± 0.0007 Å |
| α | 73.911 ± 0.003° |
| β | 88.258 ± 0.003° |
| γ | 74.257 ± 0.003° |
| Cell volume | 3313.4 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0629 |
| Residual factor for significantly intense reflections | 0.0437 |
| Weighted residual factors for significantly intense reflections | 0.1133 |
| Weighted residual factors for all reflections included in the refinement | 0.1253 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.01 |
| Diffraction radiation wavelength | 0.7749 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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