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Information card for entry 4105706
Preview
| Coordinates | 4105706.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H50 Cl2 Ni P2 S2 |
|---|---|
| Calculated formula | C52 H50 Cl2 Ni P2 S2 |
| SMILES | [P]1(c2ccccc2)(c2ccccc2)[Ni]2([P](CC[S]2CCc2ccc3ccccc3c2)(c2ccccc2)c2ccccc2)([S](CC1)CCc1ccc2ccccc2c1)(Cl)Cl |
| Title of publication | Plasticity of the Nickel(II) Coordination Environment in Complexes with Hemilabile Phosphino Thioether Ligands |
| Authors of publication | Charles W. Machan; Alexander M. Spokoyny; Matthew R. Jones; Amy A. Sarjeant; Charlotte L. Stern; Chad A. Mirkin |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2011 |
| Journal volume | 133 |
| Pages of publication | 3023 - 3033 |
| a | 15.378 ± 0.002 Å |
| b | 9.702 ± 0.0012 Å |
| c | 15.2472 ± 0.0016 Å |
| α | 90° |
| β | 105.465 ± 0.01° |
| γ | 90° |
| Cell volume | 2192.5 ± 0.5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1466 |
| Residual factor for significantly intense reflections | 0.0701 |
| Weighted residual factors for significantly intense reflections | 0.1357 |
| Weighted residual factors for all reflections included in the refinement | 0.1582 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.82 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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