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Information card for entry 4105792
Preview
| Coordinates | 4105792.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Cr H12 N3 O8 |
|---|---|
| Calculated formula | Cr N3 O8 |
| SMILES | [Cr]1234(OO1)(OO2)(OO3)OO4.[NH4+].[NH4+].[NH4+] |
| Title of publication | M3-x(NH4)xCrO8 (M = Na, K, Rb, Cs): A New Family of Cr5±Based Magnetic Ferroelectrics |
| Authors of publication | Raghabendra Samantaray; Ronald J. Clark; Eun S. Choi; Haidong Zhou; Naresh S. Dalal |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2011 |
| Journal volume | 133 |
| Pages of publication | 3792 - 3795 |
| a | 10 ± 2 Å |
| b | 10.0176 ± 0.001 Å |
| c | 8.0201 ± 0.001 Å |
| α | 90.013 ± 0.001° |
| β | 90.008 ± 0.003° |
| γ | 90.004 ± 0.002° |
| Cell volume | 803 ± 16 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 1 |
| Hermann-Mauguin space group symbol | P 1 |
| Hall space group symbol | P 1 |
| Residual factor for all reflections | 0.0601 |
| Residual factor for significantly intense reflections | 0.0567 |
| Weighted residual factors for significantly intense reflections | 0.1569 |
| Weighted residual factors for all reflections included in the refinement | 0.1598 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.105 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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