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Information card for entry 4106405
Preview
| Coordinates | 4106405.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C43 H71 N2 O0.5 P2 Ti |
|---|---|
| Calculated formula | C43 H71 N2 O0.5 P2 Ti |
| SMILES | [Ti]12([P](C(C)C)(C(C)C)c3cc(C)ccc3N2c2ccc(C)cc2[P]1(C(C)C)C(C)C)(=NC12CC3CC(CC(C1)C3)C2)CC(C)(C)C.CCOCC |
| Title of publication | Room Temperature Dehydrogenation of Ethane to Ethylene |
| Authors of publication | Vincent N. Cavaliere; Marco G. Crestani; Balazs Pinter; Maren Pink; Chun-Hsing Chen; Mu-Hyun Baik; Daniel J. Mindiola |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2011 |
| Journal volume | 133 |
| Pages of publication | 10700 - 10703 |
| a | 14.204 ± 0.002 Å |
| b | 12.406 ± 0.002 Å |
| c | 25.237 ± 0.005 Å |
| α | 90° |
| β | 101.599 ± 0.003° |
| γ | 90° |
| Cell volume | 4356.3 ± 1.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1435 |
| Residual factor for significantly intense reflections | 0.0635 |
| Weighted residual factors for significantly intense reflections | 0.1192 |
| Weighted residual factors for all reflections included in the refinement | 0.1458 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.006 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4106405.html
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