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Information card for entry 4106503
Preview
| Coordinates | 4106503.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C59 H88 Al N5 |
|---|---|
| Calculated formula | C59 H88 Al N5 |
| SMILES | [Al]12(N(C=C3N1C=CC=C3)c1c(cccc1C(C)C)C(C)C)N(C=C1N2C=CC=C1)c1c(cccc1C(C)C)C(C)C.[N+](CCCC)(CCCC)(CCCC)CCCC.Cc1ccccc1 |
| Title of publication | Countercations Direct One- or Two-Electron Oxidation of an Al(III) Complex and Al(III)-Oxo Intermediates Activate C-H Bonds |
| Authors of publication | Thomas W. Myers; Louise A. Berben |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2011 |
| Journal volume | 133 |
| Pages of publication | 11865 - 11867 |
| a | 13.444 ± 0.001 Å |
| b | 12.1181 ± 0.0009 Å |
| c | 33.736 ± 0.003 Å |
| α | 90° |
| β | 94.184 ± 0.002° |
| γ | 90° |
| Cell volume | 5481.5 ± 0.8 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.2024 |
| Residual factor for significantly intense reflections | 0.0753 |
| Weighted residual factors for significantly intense reflections | 0.1741 |
| Weighted residual factors for all reflections included in the refinement | 0.242 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.089 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4106503.html
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