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Information card for entry 4106607
Preview
| Coordinates | 4106607.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C27 H21 N4 O0.5 |
|---|---|
| Calculated formula | C27 H20 N4 O0.5 |
| SMILES | c1(c2ccc3ccccc3c2n2c3ccccc3n(c12)C)c1nc2ccccc2n1C.O |
| Title of publication | Charge Delocalization and Enhanced Acidity in Tricationic Superelectrophiles |
| Authors of publication | Rajasekhar Reddy Naredla; Chong Zheng; Sten O. Nilsson Lill; Douglas A. Klumpp |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2011 |
| Journal volume | 133 |
| Pages of publication | 13169 - 13175 |
| a | 9.9836 ± 0.001 Å |
| b | 23.795 ± 0.002 Å |
| c | 17.0104 ± 0.0016 Å |
| α | 90° |
| β | 92.051 ± 0.002° |
| γ | 90° |
| Cell volume | 4038.4 ± 0.7 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.09 |
| Residual factor for significantly intense reflections | 0.077 |
| Weighted residual factors for significantly intense reflections | 0.2311 |
| Weighted residual factors for all reflections included in the refinement | 0.2482 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4106607.html
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