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Information card for entry 4106756
Preview
| Coordinates | 4106756.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37 H71 N3 O P Si6 U |
|---|---|
| Calculated formula | C37 H71 N3 O P Si6 U |
| SMILES | [U]1(C[Si](C)(C)N1[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)=O.C[P+](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Probing the Reactivity and Electronic Structure of a Uranium(V) Terminal Oxo Complex |
| Authors of publication | Skye Fortier; Nikolas Kaltsoyannis; Guang Wu; Trevor W. Hayton |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2011 |
| Journal volume | 133 |
| Pages of publication | 14224 - 14227 |
| a | 20.789 ± 0.0006 Å |
| b | 11.761 ± 0.0004 Å |
| c | 19.9035 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4866.4 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0364 |
| Residual factor for significantly intense reflections | 0.0262 |
| Weighted residual factors for significantly intense reflections | 0.0519 |
| Weighted residual factors for all reflections included in the refinement | 0.0552 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.977 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4106756.html
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Users of the data should acknowledge the original authors of the
structural data.