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Information card for entry 4106988
Preview
| Coordinates | 4106988.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Sm2@C92.NiOEP.2chlorobenzene D3(No. 85) |
|---|---|
| Formula | C140 H54 Cl2 N4 Ni Sm2 |
| Calculated formula | C142 H54 Cl2 N4 Ni Sm2.02 |
| Title of publication | Large Endohedral Fullerenes Containing Two Metal Ions, Sm2@D2(35)-C88, Sm2@C1(21)-C90, and Sm2@D3(85)-C92, and Their Relationship to Endohedral Fullerenes Containing Two Gadolinium Ions |
| Authors of publication | Hua Yang; Hongxiao Jin; Bo Hong; Ziyang Liu; Christine M. Beavers; Hongyu Zhen; Zhimin Wang; Brandon Q. Mercado; Marilyn M. Olmstead; Alan L. Balch |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2011 |
| Journal volume | 133 |
| Pages of publication | 16911 - 16919 |
| a | 25.587 ± 0.0009 Å |
| b | 14.9402 ± 0.0006 Å |
| c | 21.3995 ± 0.0007 Å |
| α | 90° |
| β | 97.638 ± 0.002° |
| γ | 90° |
| Cell volume | 8107.9 ± 0.5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0636 |
| Residual factor for significantly intense reflections | 0.0473 |
| Weighted residual factors for significantly intense reflections | 0.1282 |
| Weighted residual factors for all reflections included in the refinement | 0.1412 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
| Diffraction radiation wavelength | 0.7749 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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