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Information card for entry 4107312
Preview
| Coordinates | 4107312.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H48 As2 K2 O12 Te2 |
|---|---|
| Calculated formula | C24 H48 As2 K2 O12 Te2 |
| SMILES | [K]12345[O]6CC[O]1CC[O]2CC[O]3CC[O]4CC[O]5CC6.[Te]1[As][Te][As]1.[K]12345[O]6CC[O]1CC[O]2CC[O]3CC[O]4CC[O]5CC6 |
| Title of publication | [Te2As2]2-: A Planar Motif with "Conflicting" Aromaticity |
| Authors of publication | Angel Ugrinov; Ayusman Sen; Arthur C. Reber; Meichun Qian; Shiv N. Khanna |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2008 |
| Journal volume | 130 |
| Pages of publication | 782 - 783 |
| a | 10.307 ± 0.004 Å |
| b | 9.951 ± 0.004 Å |
| c | 18.585 ± 0.007 Å |
| α | 90° |
| β | 98.394 ± 0.006° |
| γ | 90° |
| Cell volume | 1885.8 ± 1.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0637 |
| Residual factor for significantly intense reflections | 0.0599 |
| Weighted residual factors for significantly intense reflections | 0.1972 |
| Weighted residual factors for all reflections included in the refinement | 0.2025 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.116 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4107312.html
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Users of the data should acknowledge the original authors of the
structural data.