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Information card for entry 4108060
Preview
| Coordinates | 4108060.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | La@C72Ad |
|---|---|
| Chemical name | La@C72Ad |
| Formula | C94 H22 Cl4 La2 |
| Calculated formula | C94 H22 Cl4 La2.0002 |
| Title of publication | Chemical Understanding of a Non-IPR Metallofullerene: Stabilization of Encaged Metals on Fused-Pentagon Bonds in La2@C72 |
| Authors of publication | Xing Lu; Hidefumi Nikawa; Tsukasa Nakahodo; Takahiro Tsuchiya; Midori O. Ishitsuka; Yutaka Maeda; Takeshi Akasaka; Makoto Toki; Hiroshi Sawa; Zdenek Slanina; Naomi Mizorogi; Shigeru Nagase |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2008 |
| Journal volume | 130 |
| Pages of publication | 9129 - 9136 |
| a | 10.4412 ± 0.0009 Å |
| b | 15.5 ± 0.0016 Å |
| c | 17.919 ± 0.0014 Å |
| α | 110.931 ± 0.005° |
| β | 95.813 ± 0.004° |
| γ | 104.328 ± 0.005° |
| Cell volume | 2566.1 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0844 |
| Residual factor for significantly intense reflections | 0.067 |
| Weighted residual factors for significantly intense reflections | 0.2015 |
| Weighted residual factors for all reflections included in the refinement | 0.2131 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.9983 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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