Information card for entry 4108852

Structure parameters

• Chemical name: meso-1,1,4,4-Tetrakis[bis(trimethylsilyl)methyl]- 3,4-dicyano-1,4-diisopropyltetrasilane
• Formula: C36 H92 N2 Si12
• Calculated formula: C36 H92 N2 Si12
• SMILES: C[Si](C([Si](C([Si](C)(C)C)[Si](C)(C)C)([Si@H](C#N)[Si@H](C#N)[Si](C([Si](C)(C)C)[Si](C)(C)C)(C([Si](C)(C)C)[Si](C)(C)C)C(C)C)C(C)C)[Si](C)(C)C)(C)C
• Title of publication: Reactivity of the Disilyne RSi\τbSiR (R = SiiPr[CH(SiMe3)2]2) toward Silylcyanide: Two Pathways To Form the Bis-Adduct [RSiSiR(CNSiMe3)2] with Some Silaketenimine Character and a 1,4-Diaza-2,3-disilabenzene Analogue
• Authors of publication: Katsuhiko Takeuchi; Masaaki Ichinohe; Akira Sekiguchi
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2008
• Journal volume: 130
• Pages of publication: 16848 - 16849
• a: 9.627 ± 0.0005 Å
• b: 10.958 ± 0.0003 Å
• c: 14.608 ± 0.0008 Å
• α: 105.456 ± 0.003°
• β: 95.914 ± 0.003°
• γ: 110.091 ± 0.003°
• Cell volume: 1362.31 ± 0.12 ų
• Cell temperature: 150 ± 0.1 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0492
• Residual factor for significantly intense reflections: 0.0432
• Weighted residual factors for significantly intense reflections: 0.1183
• Weighted residual factors for all reflections included in the refinement: 0.123
• Goodness-of-fit parameter for all reflections included in the refinement: 1.024
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No