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Information card for entry 4109739
Preview
| Coordinates | 4109739.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C29 H46 Ga Mo N Si3 |
|---|---|
| Calculated formula | C29 H46 Ga Mo N Si3 |
| SMILES | [Mo]123456789%10%11[c]%12([Ga]%13([N](C)(C)[Si](C%13([Si](C)(C)C)[Si](C)(C)C)(C)C)[c]%136[cH]7[cH]8[cH]9[cH]%10[cH]%11%13)[cH]1[cH]2[cH]3[cH]4[cH]5%12.c1ccccc1 |
| Title of publication | [1]Molybdarenophanes: Strained Metallarenophanes with Aluminum, Gallium, and Silicon in Bridging Positions |
| Authors of publication | Clinton L. Lund; Jörg A. Schachner; J. Wilson Quail; Jens Müller |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2007 |
| Journal volume | 129 |
| Pages of publication | 9313 - 9320 |
| a | 9.2069 ± 0.0003 Å |
| b | 13.3959 ± 0.0004 Å |
| c | 13.5754 ± 0.0003 Å |
| α | 110.073 ± 0.002° |
| β | 90.698 ± 0.002° |
| γ | 96.944 ± 0.002° |
| Cell volume | 1558.49 ± 0.08 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0655 |
| Residual factor for significantly intense reflections | 0.0441 |
| Weighted residual factors for significantly intense reflections | 0.0986 |
| Weighted residual factors for all reflections included in the refinement | 0.1107 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4109739.html
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Users of the data should acknowledge the original authors of the
structural data.