Information card for entry 4110486

Structure parameters

• Formula: C52 H46 B Cl F20 N P Ti
• Calculated formula: C52 H46 B Cl F20 N P Ti
• SMILES: [Ti]12345(Cl)([N](=P(C(C)(C)C)(C(C)(C)C)C(C)(C)C)c6ccccc56)[c]5([c]1([c]2([c]3([c]45C)C)C)C)C.Fc1c(c(F)c(F)c(F)c1F)[B-](c1c(F)c(F)c(F)c(F)c1F)(c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F
• Title of publication: Competitive ArC-H and ArC-X (X = Cl, Br) Activation in Halobenzenes at Cationic Titanium Centers
• Authors of publication: Kuangbiao Ma; Warren E. Piers; Masood Parvez
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2006
• Journal volume: 128
• Pages of publication: 3303 - 3312
• a: 12.343 ± 0.002 Å
• b: 14.797 ± 0.003 Å
• c: 14.932 ± 0.004 Å
• α: 83.933 ± 0.009°
• β: 89.154 ± 0.009°
• γ: 67.526 ± 0.015°
• Cell volume: 2505 ± 1 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0693
• Residual factor for significantly intense reflections: 0.0417
• Weighted residual factors for significantly intense reflections: 0.1003
• Weighted residual factors for all reflections included in the refinement: 0.1141
• Goodness-of-fit parameter for all reflections included in the refinement: 0.999
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No