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Information card for entry 4110747
Preview
| Coordinates | 4110747.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Formula | C20 H26 Ir N O2 |
|---|---|
| Calculated formula | C20 H26 Ir N O2 |
| SMILES | [Ir]1234(OC(=O)[C@H]5[N]1(CCC5)Cc1ccccc1)[CH]1=[CH]2CC[CH]3=[CH]4CC1 |
| Title of publication | Rhodium-Mediated Stereoselective Polymerization of "Carbenes" |
| Authors of publication | Dennis G. H. Hetterscheid; Coen Hendriksen; Wojciech I. Dzik; Jan M. M. Smits; Ernst R. H. van Eck; Alan E. Rowan; Vincenzo Busico; Michele Vacatello; Valeria Van Axel Castelli; Annalaura Segre; Erica Jellema; Tom G. Bloemberg; Bas de Bruin |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2006 |
| Journal volume | 128 |
| Pages of publication | 9746 - 9752 |
| a | 9.0881 ± 0.0005 Å |
| b | 10.9092 ± 0.0004 Å |
| c | 17.6478 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1749.67 ± 0.13 Å3 |
| Cell temperature | 208 ± 2 K |
| Ambient diffraction temperature | 208 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0137 |
| Residual factor for significantly intense reflections | 0.0124 |
| Weighted residual factors for all reflections | 0.0256 |
| Weighted residual factors for significantly intense reflections | 0.0252 |
| Weighted residual factors for all reflections included in the refinement | 0.0256 |
| Goodness-of-fit parameter for all reflections | 1.078 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.078 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4110747.html
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Users of the data should acknowledge the original authors of the
structural data.