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Information card for entry 4111445
Preview
| Coordinates | 4111445.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C23 H28 F12 Ir N4 P2 |
|---|---|
| Calculated formula | C23 H28 F12 Ir N4 P2 |
| SMILES | [Ir]1234([CH2]=[CH2]1)[n]1c(C[N]4(Cc4[n]2c(ccc4)C)Cc2[n]3c(ccc2)C)cccc1C.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | IrII(ethene): Metal or Carbon Radical? |
| Authors of publication | Dennis G. H. Hetterscheid; Jasper Kaiser; Eduard Reijerse; Theo P. J. Peters; Simone Thewissen; Arno N. J. Blok; Jan M. M. Smits; René de Gelder; Bas de Bruin |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2005 |
| Journal volume | 127 |
| Pages of publication | 1895 - 1905 |
| a | 13.072 ± 0.002 Å |
| b | 12.454 ± 0.002 Å |
| c | 18.86 ± 0.003 Å |
| α | 90° |
| β | 109.734 ± 0.011° |
| γ | 90° |
| Cell volume | 2890.1 ± 0.8 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/a 1 |
| Hall space group symbol | -P 2yab |
| Residual factor for all reflections | 0.0546 |
| Residual factor for significantly intense reflections | 0.0393 |
| Weighted residual factors for all reflections | 0.1011 |
| Weighted residual factors for significantly intense reflections | 0.0939 |
| Weighted residual factors for all reflections included in the refinement | 0.1011 |
| Goodness-of-fit parameter for all reflections | 1.051 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4111445.html
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Users of the data should acknowledge the original authors of the
structural data.