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Information card for entry 4111617
Preview
| Coordinates | 4111617.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C60 H52 P4 Pt2 |
|---|---|
| Calculated formula | C60 H52 P4 Pt2 |
| SMILES | [Pt]1([P](C#CC#C[P]([Pt]([P](C#CC#C[P]1(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(C)C)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(C)C |
| Title of publication | Metal-Templated Diyne Cyclodimerization and Cyclotrimerization |
| Authors of publication | Maria Paz Martin-Redondo; Ludmila Scoles; Brian T. Sterenberg; Konstantin A. Udachin; Arthur J. Carty |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2005 |
| Journal volume | 127 |
| Pages of publication | 5038 - 5039 |
| a | 18.2966 ± 0.0013 Å |
| b | 15.3838 ± 0.0011 Å |
| c | 19.0807 ± 0.0014 Å |
| α | 90° |
| β | 103.864 ± 0.001° |
| γ | 90° |
| Cell volume | 5214.2 ± 0.7 Å3 |
| Cell temperature | 125 ± 2 K |
| Ambient diffraction temperature | 125 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0712 |
| Residual factor for significantly intense reflections | 0.0353 |
| Weighted residual factors for significantly intense reflections | 0.0643 |
| Weighted residual factors for all reflections included in the refinement | 0.0716 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.904 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4111617.html
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Users of the data should acknowledge the original authors of the
structural data.