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Information card for entry 4112314
Preview
| Coordinates | 4112314.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 4,5:4''',5'''-Bis(bicyclo[2.2.2]octeno)- 3',4':3'',4''-bis(bicyclo[2.2.2]octano)- 2,2':5',2'',5'',2'''-quarterthiophene dication bis(hexafluoroantimonate) |
|---|---|
| Formula | C40 H42 F12 S4 Sb2 |
| Calculated formula | C40 H42 F12 S4 Sb2 |
| Title of publication | Crystal Structures and Spectroscopic Characterization of Radical Cations and Dications of Oligothiophenes Stabilized by Annelation with Bicyclo[2.2.2]octene Units: Sterically Segregated Cationic Oligothiophenes |
| Authors of publication | Tohru Nishinaga; Atsushi Wakamiya; Daisuke Yamazaki; Koichi Komatsu |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2004 |
| Journal volume | 126 |
| Pages of publication | 3163 - 3174 |
| a | 7.918 ± 0.005 Å |
| b | 9.912 ± 0.005 Å |
| c | 13.964 ± 0.005 Å |
| α | 109.542 ± 0.005° |
| β | 100.177 ± 0.005° |
| γ | 97.274 ± 0.005° |
| Cell volume | 996 ± 0.9 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0834 |
| Residual factor for significantly intense reflections | 0.0509 |
| Weighted residual factors for significantly intense reflections | 0.081 |
| Weighted residual factors for all reflections included in the refinement | 0.0872 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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