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Information card for entry 4112736
Preview
| Coordinates | 4112736.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H18 Cd F12 N2 O4 |
|---|---|
| Calculated formula | C16 H18 Cd F12.018 N2 O4 |
| Title of publication | Transparent Conducting Oxides: Texture and Microstructure Effects on Charge Carrier Mobility in MOCVD-Derived CdO Thin Films Grown with A Thermally Stable, Low-Melting Precursor |
| Authors of publication | Andrew W. Metz; John R. Ireland; Jian-Guo Zheng; Ricardo P. S. M. Lobo; Yu Yang; Jun Ni; Charlotte L. Stern; Vinayak P. Dravid; Nicole Bontemps; Carl R. Kannewurf; Kenneth R. Poeppelmeier; Tobin J. Marks |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2004 |
| Journal volume | 126 |
| Pages of publication | 8477 - 8492 |
| a | 15.0844 ± 0.0018 Å |
| b | 11.137 ± 0.002 Å |
| c | 27.709 ± 0.005 Å |
| α | 90 ± 0.003° |
| β | 90 ± 0.003° |
| γ | 90 ± 0.003° |
| Cell volume | 4655 ± 1.3 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0659 |
| Residual factor for significantly intense reflections | 0.0593 |
| Weighted residual factors for significantly intense reflections | 0.1248 |
| Weighted residual factors for all reflections included in the refinement | 0.1292 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.171 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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