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Information card for entry 4112896
Preview
| Coordinates | 4112896.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H51 F6 Ni P3 Si |
|---|---|
| Calculated formula | C22 H51 F6 Ni P3 Si |
| SMILES | [Ni]1([P](C(C)(C)C)(CC[P]1(C(C)(C)C)C(C)(C)C)C(C)(C)C)C[Si](C)(C)C.[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | Preparation of Stable Alkyl Complexes of Ni(I) and Their One-Electron Oxidation to Ni(II) Complex Cations |
| Authors of publication | Kristina D. Kitiachvili; Daniel J. Mindiola; Gregory L. Hillhouse |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2004 |
| Journal volume | 126 |
| Pages of publication | 10554 - 10555 |
| a | 11.806 ± 0.003 Å |
| b | 18.744 ± 0.005 Å |
| c | 13.238 ± 0.004 Å |
| α | 90° |
| β | 92.104 ± 0.005° |
| γ | 90° |
| Cell volume | 2927.5 ± 1.4 Å3 |
| Cell temperature | 373 ± 2 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0902 |
| Residual factor for significantly intense reflections | 0.0711 |
| Weighted residual factors for significantly intense reflections | 0.149 |
| Weighted residual factors for all reflections included in the refinement | 0.1571 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.132 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4112896.html
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