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Information card for entry 4113207
Preview
| Coordinates | 4113207.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 03138 |
|---|---|
| Formula | C30 H30 N4 S3 |
| Calculated formula | C30 H30 N4 S3 |
| Title of publication | Preparation and Characterization of π-Stacking Quinodimethane Oligothiophenes. Predicting Semiconductor Behavior and Bandwidths from Crystal Structures and Molecular Orbital Calculations |
| Authors of publication | Daron E. Janzen; Michael W. Burand; Paul C. Ewbank; Ted M. Pappenfus; Hiroyuki Higuchi; Demetrio A. da Silva Filho; Victor G. Young; Jean-Luc Brédas; Kent R. Mann |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2004 |
| Journal volume | 126 |
| Pages of publication | 15295 - 15308 |
| a | 7.951 ± 0.003 Å |
| b | 13.212 ± 0.004 Å |
| c | 13.936 ± 0.004 Å |
| α | 95.876 ± 0.006° |
| β | 98.489 ± 0.006° |
| γ | 97.492 ± 0.006° |
| Cell volume | 1424.5 ± 0.8 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1434 |
| Residual factor for significantly intense reflections | 0.0503 |
| Weighted residual factors for significantly intense reflections | 0.0947 |
| Weighted residual factors for all reflections included in the refinement | 0.1215 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.963 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4113207.html
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Users of the data should acknowledge the original authors of the
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