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Information card for entry 4113252
Preview
| Coordinates | 4113252.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H42 Li2 N4 |
|---|---|
| Calculated formula | C26 H42 Li2 N4 |
| SMILES | [Li]123[C]4(=C(C=CC=C4)[C@H]([N]1(CC[N]2(C)C)C)C)[Li]12[N]([C@@H](C4=CC=CC=[C]314)C)(CC[N]2(C)C)C |
| Title of publication | Diastereoselective Self-Assembly of Chiral Diamine-Chelated Aryllithiums to Dimeric Aggregates |
| Authors of publication | Anne M. Arink; Claudia M. P. Kronenburg; Johann T. B. H. Jastrzebski; Martin Lutz; Anthony L. Spek; Robert A. Gossage; Gerard van Koten |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2004 |
| Journal volume | 126 |
| Pages of publication | 16249 - 16258 |
| a | 9.6895 ± 0.0001 Å |
| b | 17.262 ± 0.0002 Å |
| c | 16.2017 ± 0.0002 Å |
| α | 90° |
| β | 94.7843 ± 0.0005° |
| γ | 90° |
| Cell volume | 2700.46 ± 0.05 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0438 |
| Residual factor for significantly intense reflections | 0.0365 |
| Weighted residual factors for significantly intense reflections | 0.0855 |
| Weighted residual factors for all reflections included in the refinement | 0.0904 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4113252.html
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Users of the data should acknowledge the original authors of the
structural data.