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Information card for entry 4113837
Preview
| Coordinates | 4113837.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H64 Ba O4 Si6 |
|---|---|
| Calculated formula | C24 H64 Ba O4 Si6 |
| SMILES | [Ba]123(C([Si]([O]1C)(C)C)([Si](C)(C)C)[Si](C)(C)C)(C([Si]([O]2C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[O](C)CC[O]3C |
| Title of publication | Alkyl Complexes of Strontium and Barium: Synthesis and Structural Characterization of {(Me3Si)2(MeOMe2Si)C}2Sr(THF) and {(Me3Si)2(MeOMe2Si)C}2Ba(MeOCH2CH2OMe) |
| Authors of publication | Keith Izod; Stephen T. Liddle; William Clegg |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2003 |
| Journal volume | 125 |
| Pages of publication | 7534 - 7535 |
| a | 17.76 ± 0.0007 Å |
| b | 13.149 ± 0.0005 Å |
| c | 16.8334 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3931 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 29 |
| Hermann-Mauguin space group symbol | P c a 21 |
| Hall space group symbol | P 2c -2ac |
| Residual factor for all reflections | 0.0251 |
| Residual factor for significantly intense reflections | 0.0196 |
| Weighted residual factors for significantly intense reflections | 0.0417 |
| Weighted residual factors for all reflections included in the refinement | 0.0434 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4113837.html
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