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Information card for entry 4113883
Preview
| Coordinates | 4113883.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H54 O Si4 Zr |
|---|---|
| Calculated formula | C34 H54 O Si4 Zr |
| SMILES | [Zr]123456789([O]%10CCCC%10)([CH]%10=[CH]1[CH]2=[CH]3C14[C]5%10=C(C=C1[Si](C)(C)C)[Si](C)(C)C)[c]12[c]9([c]8([Si](C)(C)C)[cH]7[c]61[Si](C)(C)C)cccc2 |
| Title of publication | Synthesis of a Zirconium Sandwich Complex and Crystallographic Characterization of Its Adduct with Tetrahydrofuran |
| Authors of publication | Christopher A. Bradley; Emil Lobkovsky; Paul J. Chirik |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2003 |
| Journal volume | 125 |
| Pages of publication | 8110 - 8111 |
| a | 12.773 ± 0.003 Å |
| b | 16.911 ± 0.004 Å |
| c | 17.389 ± 0.004 Å |
| α | 90 ± 0.005° |
| β | 94.983 ± 0.006° |
| γ | 90 ± 0.006° |
| Cell volume | 3741.9 ± 1.5 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0849 |
| Residual factor for significantly intense reflections | 0.0532 |
| Weighted residual factors for significantly intense reflections | 0.1448 |
| Weighted residual factors for all reflections included in the refinement | 0.1618 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.045 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4113883.html
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Users of the data should acknowledge the original authors of the
structural data.