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Information card for entry 4114182
Preview
| Coordinates | 4114182.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | (EDT-TTF-(CONH2)2)2 HSO4 |
|---|---|
| Formula | C20 H17 N4 O8 S13 |
| Calculated formula | C20 H16 N4 O8 S13 |
| Title of publication | Singular Crystalline β'-Layered Topologies Directed by Ribbons of Self-Complementary Amide...Amide Ring Motifs in [EDT-TTF-(CONH2)2]2X (X = HSO4-, ClO4-, ReO4-, AsF6-): Coupled Activation of Ribbon Curvature, Electron Interactions, and Magnetic Susceptibility |
| Authors of publication | Stéphane A. Baudron; Narcis Avarvari; Patrick Batail; Claude Coulon; Rodolphe Clérac; Enric Canadell; Pascale Auban-Senzier |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2003 |
| Journal volume | 125 |
| Pages of publication | 11583 - 11590 |
| a | 15.1947 ± 0.0009 Å |
| b | 12.2388 ± 0.0009 Å |
| c | 17.1149 ± 0.0011 Å |
| α | 90° |
| β | 99.799 ± 0.007° |
| γ | 90° |
| Cell volume | 3136.3 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0694 |
| Residual factor for significantly intense reflections | 0.0346 |
| Weighted residual factors for significantly intense reflections | 0.0593 |
| Weighted residual factors for all reflections included in the refinement | 0.0641 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.793 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4114182.html
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structural data.