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Information card for entry 4115489
Preview
| Coordinates | 4115489.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | cis-Dimethyl(bis(dicyclohexylphosphino)methane)palladium(II) |
|---|---|
| Formula | C27 H52 P2 Pd |
| Calculated formula | C27 H52 P2 Pd |
| SMILES | [Pd]1([P](C[P]1(C1CCCCC1)C1CCCCC1)(C1CCCCC1)C1CCCCC1)(C)C |
| Title of publication | Facile Reductive Elimination of Ethane from Strained Dimethylpalladium(II) Complexes |
| Authors of publication | Steven M. Reid; Joel T. Mague; Mark J. Fink |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2001 |
| Journal volume | 123 |
| Pages of publication | 4081 - 4082 |
| a | 16.633 ± 0.002 Å |
| b | 14.7594 ± 0.0014 Å |
| c | 23.571 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5786.5 ± 1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.1015 |
| Residual factor for significantly intense reflections | 0.039 |
| Weighted residual factors for significantly intense reflections | 0.1004 |
| Weighted residual factors for all reflections included in the refinement | 0.1202 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4115489.html
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