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Information card for entry 4115965
Preview
| Coordinates | 4115965.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H44 La N Si3 |
|---|---|
| Calculated formula | C24 H44 La N Si3 |
| SMILES | [La]123456789(N([SiH](C)C)[SiH](C)C)[c]%10([Si](C)(C)[c]%117[c]8([c]9([c]1([c]%112C)C)C)C)[c]3([c]4([c]5([c]6%10C)C)C)C |
| Title of publication | C2-Symmetric ansa-Lanthanidocene Complexes. Synthesis via Silylamine Elimination and β-SiH Agostic Rigidity |
| Authors of publication | Jörg Eppinger; Michael Spiegler; Wolfgang Hieringer; Wolfgang A. Herrmann; Reiner Anwander |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2000 |
| Journal volume | 122 |
| Pages of publication | 3080 - 3096 |
| a | 9.529 ± 0.001 Å |
| b | 11.145 ± 0.001 Å |
| c | 13.573 ± 0.001 Å |
| α | 79.68 ± 0.01° |
| β | 83.26 ± 0.01° |
| γ | 77.61 ± 0.01° |
| Cell volume | 1380.4 ± 0.2 Å3 |
| Cell temperature | 193 K |
| Ambient diffraction temperature | 193 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0291 |
| Residual factor for significantly intense reflections | 0.0247 |
| Weighted residual factors for significantly intense reflections | 0.0594 |
| Weighted residual factors for all reflections included in the refinement | 0.0605 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4115965.html
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Users of the data should acknowledge the original authors of the
structural data.