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Information card for entry 4115995
Preview
| Coordinates | 4115995.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H28 Cl2 N O P2 Tc |
|---|---|
| Calculated formula | C28 H28 Cl2 N O P2 Tc |
| SMILES | [Tc]12(Cl)(Cl)([P](CC[O]2CC[P]1(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)#N |
| Title of publication | Geometrically Controlled Selective Formation of Nitrido Technetium(V) Asymmetrical Heterocomplexes with Bidentate Ligands |
| Authors of publication | Cristina Bolzati; Alessandra Boschi; Adriano Duatti; Sushumna Prakash; Licia Uccelli; Fiorenzo Refosco; Francesco Tisato; Giuliano Bandoli |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2000 |
| Journal volume | 122 |
| Pages of publication | 4510 - 4511 |
| a | 20.049 ± 0.006 Å |
| b | 13.635 ± 0.003 Å |
| c | 20.125 ± 0.006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5502 ± 3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0774 |
| Residual factor for significantly intense reflections | 0.0452 |
| Weighted residual factors for all reflections | 0.1145 |
| Weighted residual factors for significantly intense reflections | 0.0976 |
| Goodness-of-fit parameter for all reflections | 1.036 |
| Goodness-of-fit parameter for significantly intense reflections | 1.071 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4115995.html
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