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Information card for entry 4116070
Preview
| Coordinates | 4116070.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 00104 |
|---|---|
| Chemical name | A(iPr)CuSCPh2(CH2OCH3) |
| Formula | C44 H56 Cu N2 O S |
| Calculated formula | C44 H56 Cu N2 O S |
| SMILES | [Cu]1(N(C(=CC(=[N]1c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C)SC(COC)(c1ccccc1)c1ccccc1 |
| Title of publication | A Structural Model of the Type 1 Copper Protein Active Site: N2S(thiolate)S(thioether) Ligation in a Cu(II) Complex |
| Authors of publication | Patrick L. Holland; William B. Tolman |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2000 |
| Journal volume | 122 |
| Pages of publication | 6331 - 6332 |
| a | 8.9674 ± 0.0005 Å |
| b | 11.8249 ± 0.0006 Å |
| c | 37.037 ± 0.002 Å |
| α | 90° |
| β | 92.577 ± 0.001° |
| γ | 90° |
| Cell volume | 3923.4 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1083 |
| Residual factor for significantly intense reflections | 0.0648 |
| Weighted residual factors for significantly intense reflections | 0.1263 |
| Weighted residual factors for all reflections included in the refinement | 0.14 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.042 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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