Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4116196
Preview
| Coordinates | 4116196.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H27 Cl F6 N4 O2 P2 Ru |
|---|---|
| Calculated formula | C28 H27 Cl F6 N4 O2 P2 Ru |
| SMILES | [Ru]12(Cl)([P](O)(OCC)c3ccccc3)([n]3ccccc3c3cccc[n]13)[n]1c(cccc1)c1cccc[n]21.[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | Atropisomer and Diastereomer Generation and Control in Ruthenium Bis(bipyridine) Phosphonite Complexes |
| Authors of publication | Dusan Hesek; Guy A. Hembury; Michael G. B. Drew; Seiji Taniguchi; Yoshihisa Inoue |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2000 |
| Journal volume | 122 |
| Pages of publication | 10236 - 10237 |
| a | 14.55 ± 0.002 Å |
| b | 15.126 ± 0.004 Å |
| c | 15.9844 ± 0.0016 Å |
| α | 90° |
| β | 111.435 ± 0.008° |
| γ | 90° |
| Cell volume | 3274.6 ± 1 Å3 |
| Cell temperature | 296.2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.13 |
| Residual factor for significantly intense reflections | 0.0677 |
| Weighted residual factors for significantly intense reflections | 0.1967 |
| Weighted residual factors for all reflections included in the refinement | 0.2182 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.286 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4116196.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.