Information card for entry 4116512

Structure parameters

• Formula: C24 H74 N2 P6 Ru2 Si2
• Calculated formula: C24 H74 N2 P6 Ru2 Si2
• SMILES: C[P](C)(C)[RuH]([N]#[N][RuH]([P](C)(C)C)([P](C)(C)C)([P](C)(C)C)[Si](C)(C)C)([P](C)(C)C)([P](C)(C)C)[Si](C)(C)C
• Title of publication: Formation and Interconversion of Ruthenium-Silene and 16-Electron Ruthenium Silyl Complexes
• Authors of publication: Vladimir K. Dioumaev; Karl Plössl; Patrick J. Carroll; Donald H. Berry
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 1999
• Journal volume: 121
• Pages of publication: 8391 - 8392
• a: 13.6792 ± 0.0006 Å
• b: 14.7758 ± 0.0007 Å
• c: 20.9824 ± 0.0012 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 4241 ± 0.4 ų
• Cell temperature: 220 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 6
• Space group number: 20
• Hermann-Mauguin space group symbol: C 2 2 21
• Hall space group symbol: C 2c 2
• Residual factor for all reflections: 0.0512
• Residual factor for significantly intense reflections: 0.048
• Weighted residual factors for all reflections: 0.109
• Weighted residual factors for significantly intense reflections: 0.1069
• Goodness-of-fit parameter for all reflections: 1.108
• Goodness-of-fit parameter for significantly intense reflections: 1.118
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No