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Information card for entry 4116547
Preview
| Coordinates | 4116547.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Chemical name | 4',3'',4''',3''''-tetramethyl-2,2':5,2'':5'',2''':5''',2'''':5'''',2'''''.- sexithiophene (triclinic form) ? |
|---|---|
| Formula | C28 H22 S6 |
| Calculated formula | C28 H22 S6 |
| Title of publication | Solid-State Conformation, Molecular Packing, and Electrical and Optical Properties of Processable β-Methylated Sexithiophenes |
| Authors of publication | Giovanna Barbarella; Massimo Zambianchi; Luciano Antolini; Paolo Ostoja; Piera Maccagnani; Alessandro Bongini; Elisabeth A. Marseglia; Emilio Tedesco; Giuseppe Gigli; Roberto Cingolani |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 1999 |
| Journal volume | 121 |
| Pages of publication | 8920 - 8926 |
| a | 7.595 ± 0.002 Å |
| b | 7.68 ± 0.002 Å |
| c | 11.438 ± 0.003 Å |
| α | 99.47 ± 0.02° |
| β | 91.62 ± 0.02° |
| γ | 107.08 ± 0.02° |
| Cell volume | 627 ± 0.3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0511 |
| Residual factor for significantly intense reflections | 0.0388 |
| Weighted residual factors for all reflections | 0.1165 |
| Weighted residual factors for significantly intense reflections | 0.0957 |
| Goodness-of-fit parameter for all reflections | 1.053 |
| Goodness-of-fit parameter for significantly intense reflections | 1.072 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4116547.html
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Users of the data should acknowledge the original authors of the
structural data.